Requirements for practical IDDQ testing of deep submicron circuits. Conference Quiescent Current for IDDQ TestingÓ, IEEE VLSI Test. Symp. , pp. By this definition, all CMOS circuits are % IDDQ testable. Faults detected by I DDQ tests: Bridging Faults: Shorts between two nodes causing. IDDQ testing is a cost effective test strategy for digital CMOS ICs with the voltage on the circuit s output pins) and/or IDDQ Test Sets (the ATE stimulates VLSI. Xerox. Yamaha. Cadence Design Systems Inc. \ Veda Design.

Author: Nerg Kazranris
Country: Burma
Language: English (Spanish)
Genre: Politics
Published (Last): 27 September 2004
Pages: 49
PDF File Size: 4.31 Mb
ePub File Size: 18.94 Mb
ISBN: 300-3-97167-550-1
Downloads: 77192
Price: Free* [*Free Regsitration Required]
Uploader: Akinogul

Design, Automation and Test in Europe. Many common semiconductor manufacturing faults will cause the current to increase by orders of magnitude, which can be easily detected.

This has the advantage of checking the chip for many possible faults with one measurement. From Wikipedia, the free encyclopedia. Iddq testing is somewhat more complex than just measuring the supply current. Iddq testing uses the principle that in a correctly operating quiescent CMOS digital circuitthere is no static current path between the power supply and ground, except for a small amount of leakage.


However, a different input that attempts to set the signal to 0 will show a large increase in quiescent current, signalling a bad part.

cigcuits Also, increasing circuit size means a single fault will have a lower percentage effect, making it harder for the test to detect. Sabade, Sagar; Walker, D. It relies on measuring the supply current Idd in the quiescent state when circuitts circuit is not switching and inputs are held at static values. If a line is shorted to Vdd, for example, it will still draw no extra current if the gate driving the signal is attempting to set it to ‘1’.

Iddq testing – Wikipedia

Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. This allows each block to be tested individually or in combination, which makes the tests much easier when compared to testing the whole chip.

By using this site, you agree to the Terms of Use and Privacy Policy. Views Read Edit View history. Compared to scan chain testingIddq testing is time consuming, and thus more expensive, as is achieved circuots current measurements that take much more time than reading digital pins in festing production.


This page was last edited on 11 Novemberat This is because the observability is through the shared power supply connection. The current consumed in the state is commonly called Iddq for Idd quiescent and hence the name.

Iddq testing

Retrieved 11 November Typical Iddq tests may use 20 or so inputs. As device geometry shrinks, i.

This makes it difficult to tell a low leakage part with a defect from a naturally high leakage part. However, Iddq is so useful that designers kf taking steps to keep it working.

One particular technique that helps is power gatingwhere the entire power supply to each block can be switched off using a low leakage switch. Another advantage is that it may catch faults that are not found by conventional stuck-at fault test vectors. Retrieved from ” https: Note that Iddq test inputs require only controllabilityidrq not observability.